Local image fits show a broad component in the Sector 82 event at TOI-7857.01

We tested two public TESS events linked by a pipeline fit at TOI-7857. Four shallow dips in Sectors 55 and 82 have independently fitted binary phases from 0.56104 to 0.56376. The Sector 55 dip is the earlier event in the public 145.888533-day two-event fit. Its depth is close to the other shallow dips. Its center is 29.9 minutes earlier than a fixed-period projection from Sector 82. Residual bootstrap percentiles are -39.6 and -22.3 minutes. Thus the phase association is approximate. The separate Sector 82 event sets the catalog time of TOI-7857.01 and occurs near binary phase 0.1475. Its local corrected-flux depth is 5939 parts per million. Pixel fits show a broad component after background removal. The nominal component is 2.09 electrons per second per pixel. It remains positive, from 0.89 to 2.62, across 36 tested spatial and time-baseline models. A broad signal is also present in the estimated background and in the calibrated total flux. These results limit a simple repeated-transit interpretation. They do not identify the event cause or exclude an overlapping transit. The binary, the event trains and a pipeline depth warning were already public. We add event-association measurements and a spatial audit. The package preserves source files, source hashes, pixel rows, code, all bootstrap draws, tables and figures. A fresh FITS extraction matched all 54 saved arrays. We do not claim a new planet or change the official candidate status.

TESS · TOI-7857.01 · TIC 408313280 · binary stars · planet candidate tests · background light · difference images · public astronomical data