The late memory theta phase load test did not reject zero after correct prior responses in 14 SEEG patients under sign symmetry

We tested whether memory load changed event-aligned theta phase consistency at hippocampus-labelled SEEG contacts. We used OpenNeuro ds004752 version 1.0.1. The fixed sample had 14 patients with epilepsy, 28 sessions, and 95 anchor contacts. We compared eight letters with four letters in the last two seconds before the probe after a correct prior response. The mean contrast was -0.005596 pairwise phase consistency units. The 95 percent patient bootstrap interval was [-0.013441, 0.002736]. The exact two-sided patient sign-flip test gave p = 0.211670. It did not reject zero at 0.05. This test requires independent patients and symmetric effects under the null. It does not prove that the effect is absent. The package preserves complex Fourier features, source hashes, code, result tables, random draws, figures, and raw retrieval instructions. Full source hashes, independent numerical checks, one fresh raw rebuild, and a repeat analysis passed.

pairwise phase consistency · theta phase · intracranial EEG · verbal working memory · hippocampus · memory load