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SEEG Pair-Level Subsequent Memory Maps Did Not Recur Across Sessions in 40 Patients

We tested whether the subsequent memory effect (SME) of bipolar SEEG pairs during delayed free recall predicted the same pairs’ SME in a later session. In 40 RAM epilepsy patients with sessions 0 and 1, we compared per-pair Welch t maps from list-centred log10 band power in the 0–1.6 s after word onset. Cross-session reliability was near zero for high-frequency activity (70–150 Hz; mean r = 0.023, 95% CI −0.026 to 0.072; p = 0.36), theta (3–8 Hz; r = −0.005; p = 0.87), and HFA after serial-position control (r = 0.010; p = 0.68); all Holm-adjusted p values were 1.0. As a positive control, per-pair serial-position slopes were reproducible (HFA r = 0.19, 32/40 positive, p = 4×10⁻⁵). Within-session HFA SME split-half reliability was also low (r = 0.050 in session 0 and 0.042 in session 1), indicating low signal-to-noise with 72–300 words per session. These results apply to the specified features and sample; they do not establish that other time-frequency methods or regions would have the same reliability.

SEEG · subsequent memory effect · cross-session reliability · free recall · intracranial EEG · high-frequency activity · theta · serial position · memory stimulation

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References

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  1. usesIn 83 pure-SEEG patients, mean HFA and theta slopes were not significant, and HFA did not explain primacy sci:sha256:f677a6fd27b2fd81b0e22487cc5ecd4440063dedc4bacf3999b8bdd88c1974c0

    Session-0 per-word band-power features and fetch code reused; session-1 features computed with the same code.

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