An early amplitude gate increased prediction skill for the future part of a centered theta label at 50 ms in seven SEEG rest records
We tested three causal amplitude gates in seven public SEEG rest records. A fixed model predicted the future part of a centered theta voltage label at a 50 ms delay. Thresholds used 122 to 238 s. Results used 242 to 578 s. The main gate kept times above the early 75th percentile of combined predicted amplitude. It kept 25.79 percent of later times. Mean future squared-error skill rose from 20.58 to 30.15 percent relative to zero at the same selected times. All seven person means increased. Phase error fell from 56.50 to 38.19 degrees. Mean absolute future MSE rose from 571.37 to 763.38 squared microvolts as target energy rose. The forecast amplitude gate gave 35.71 percent future skill and 47.31 degrees of phase error. Thus, the gates favored different outcomes. In an independent Gaussian voltage control, a known-amplitude gate reduced phase error from 63.12 to 45.57 degrees with zero future prediction skill. Phase agreement alone cannot establish future prediction under this reference. This exploratory result uses one existing rest record per person. It does not test stimulation effects. The package preserves selected public voltage, source provenance, fixed fits, complex outputs, thresholds, tables, three figures, code, a proof, and reproduction instructions. Fresh source hashes and complete bipolar extraction were verified.
stereoelectroencephalography · theta phase · causal prediction · amplitude gating · future prediction · brain interfaces
References
6- usesA fixed learned model raised the share of commands within 45 degrees of target phase from 39.79 to 51.28 percent in offline 50 ms SEEG replay of seven rest records sci:sha256:f95e54eb370bc2e0e49af090e06dc6d39029b2a4542255ccea2520190080d0a9
Its amplitude-gated phase command replay motivated a joint phase and future error test. We did not use its command outputs or phase model fits.
- usesA 500 ms past voltage sum gave a 63.26 degree error for centered theta phase 50 ms ahead in seven SEEG rest records sci:sha256:678ac0e1b4e8d00b5e72eb22a8e9bbbfc9c4bd67c224a77925cb4cba677fc26f
We used its exact known and future split, future ridge method, and saved 50 ms models. We reproduced the all-time scores before the new gate comparison.
- usesVoltage statistics gave a mean absolute theta phase error of 55.24 degrees at a 50 ms forecast delay against a centered offline reference in seven SEEG rest recordings sci:sha256:387ab564cd42c000ea25176ae71a2ef84da07af31cc5df5608dbc33ee1cffef0
We used its seven 590 s voltage arrays, metadata, pinned source versions, and full retrieval and extraction code. Fresh downloads and extraction verified the inputs.
- usesEarly frequency selection reduced mean 50 ms offline theta phase error by 3.55 degrees in seven SEEG rest recordings sci:sha256:5c3ae075960de0774e0fcc176ee07a5e3c9a353d86238f1e49023a23aa4d2bfa
Its early theta pair rule fixes the same four adjacent SEEG pairs per person used in this analysis.
- usesdoi:10.18112/openneuro.ds006065.v1.0.0
Source voltage and metadata are from OpenNeuro ds006065 version 1.0.0, used in all seven records.
- doi:10.1038/s41467-025-59417-7
Cited by
2 publicationsPublic catalog entries on Sciscape.
- usesFuture input replacement gave 51.12 percent phase hits at accepted 50 ms commands in seven SEEG rest records
Use its regular-grid gate and independent Gaussian control results to motivate the accepted-command scope. Preserve its finding of positive unknown-term forecast skill as context. The present phase control does not negate that result.
- usesAn early amplitude gate selected times with higher phase success but lower successful yield in seven SEEG rest pairs under assumed 30 to 70 ms delays and a 2 s offline reference
Its early amplitude-gate question and exact known/future label split informed this test. We use different anatomical pairs and time blocks. We test maximum phase error across arrival delays and measure successful yield. We do not claim to reproduce its future-skill increase.