Pre-pulse RMS reduced mean 20–500 ms log-RMS forecast error in eight STReEF patients with earlier calibration after recorded contact order reversal
We tested whether voltage before a pulse helps predict voltage size after that pulse. We used public SEEG data from eight STReEF patients. The sample had 96 conditions and 960 pulses. Five early pulses per condition calibrated each forecast. Five later pulses tested it after recorded stimulation contact order reversal. Each model used only calibration responses completed before the input cutoff. The input was log RMS from centered voltage at −500 to −20 ms. The target was log RMS at 20 to 500 ms. A patient slope reduced mean squared log-RMS error by 9.98 percent against a fixed calibration mean. The descriptive 95 percent patient interval was 5.70 to 13.88 percent. All eight patients had lower error. The exact sign-flip value was 0.0078125 under independent patients and symmetric null effects. A half-second input lead gave 4.31 percent mean reduction. A background control gave 17.25 percent. Thus, the result predicts recorded voltage size and does not isolate a response caused by a pulse. This test uses a second dataset and a clinical cohort already used in other studies. The package has all measurements and forecasts, source versions and hashes, code, independent checks, and four figures. All 960 raw ranges and 147 metadata files passed source checks. A replay in a separate folder matched all numerical outputs. Online BCI benefit remains untested.
stimulation · intracranial EEG · voltage RMS · forecasting · brain-computer interface · signal processing
References
7- A five-pulse test did not establish lower SEEG size prediction error from pre-pulse RMS in eight patient sessions sci:sha256:947fe7aa6e242e0f9e723e54cb14b472f7f801ecbaac8501e809356a1e6953c5
[Legacy relation: reproduces] We tested its centered log-RMS forecast method in a second public dataset. We required all calibration responses to finish before each input cutoff. Source selection and window endpoints differ. This is a method replication and does not dispute the earlier result in HAPwave.
- usesClipped inverse pre-pulse power weights increased mean forecast error by 2.23 percent for centered 20 to 500 ms SEEG voltage in eight patients with reversed test contact order sci:sha256:424c1d54a4e0474f7c777815ebe8e7f9d509b1c6a33e7afb1164b25d88777b37
We used the fixed 96-condition STReEF sample, bipolar readout rules, metadata, and pinned source ranges. We retrieved all 960 raw ranges again and checked four window measurements against its saved products. The new target is an individual later pulse log RMS.
- usesA five-pulse check selected SEEG pairs with 60.8% mean shape agreement after contact order reversal at 20 to 500 ms in eight sessions sci:sha256:35cdaeabceeac5a3be97a54a264240386954c3bac2e4558f03b24d86d28e2bee
The included metadata retrieval and sample selection code derives from this publication through the STReEF input study. We retained the MIT notice and used that code to retrieve metadata and rebuild the sample.
- usesdoi:10.18112/openneuro.ds005448.v1.0.0
The analysis used OpenNeuro ds005448 version 1.0.0; its cached authoritative metadata records this version-specific DOI and CC0 license.
- doi:10.1111/epi.17528
- doi:10.1016/j.ynirp.2025.100274
- doi:10.1007/s12021-022-09567-6
Cited by
4 publicationsPublic catalog entries on Sciscape.
- usesEarly RMS lowered late SEEG forecast error beyond pre-pulse RMS in linear models with five calibration pulses per condition in eight STReEF patients
This study uses the fixed 96-condition STReEF sample, RMS extraction code, source pins, and pre-only forecast reference. It adds an early input and matched background windows.
- usesWith five local calibration pulses, a STReEF slope did not establish lower 20–500 ms SEEG size forecast error in eight HAPwave patients
This package supplied the STReEF measurements, fixed selection, source metadata, raw byte-range hashes, and extraction code. The new study tests transfer to a different dataset.
- usesAn RMS correction increased signed shape forecast error in eight SEEG patients after contact order reversal with two shape pulses and three fit pulses
We used its fixed metadata selection, pinned source range records, MIT retrieval and header code, past-only forecast design, and reference input and total RMS arrays. We changed the pulse split to two shape pulses, three fit pulses, and five test pulses. We freshly retrieved voltage to calculate signed and residual targets. The patient sample is reused.
- usesA HAPwave prior reduced SEEG squared log ratio error by a mean 2.16% at 20 to 500 ms across reversed contact order with five fit pulses in eight STReEF patients
Used its retained STReEF log-RMS measurements, 96-condition selection, native audit ranges, pinned source records, licences, and retrieval code through the direct input package.